Subcategory: Materials Science
Christian Nieves - University of Puerto Rico - Mayaguez Campus
Co-Author(s): Karla Echeverria, University of Puerto Rico - Mayagüez Campus, Mayagüez, PR Sergiy Lysenko, University of Puerto Rico - Mayagüez Campus, Mayagüez, PR Felix Fernandez, University of Puerto Rico - Mayagüez Campus, Mayagüez, PR Armando Rúa, University of Puerto Rico - Mayagüez Campus, Mayagüez, PR
V3O5 is an interesting material which exhibits an insulator-to-metal transition near to 430 K. Its relatively high temperature transition makes it valuable in complementary metal-oxide-semiconductor (CMOS) devices. However, the amount of information documenting its mechanical properties is quite limited. Young’s modulus of sputtered deposited V3O5 thin films has been determined by measuring the fundamental resonant frequency of silicon microcantilevers coated with V3O5. The films were then characterized by four-point probe electrical resistivity measurements, Raman Spectroscopy, X-ray diffraction, atomic force microscopy and laser deflection techniques, which were used to measure the cantilevers’ resonant frequencies. The value of Young’s modulus was found to be approximately 160 GPa. In future work, it should be of interest to extend these measurements to thicker films and to compare the results, which could be obtained with other techniques, such as nanoindentation, with these.
Funder Acknowledgement(s): PR-LSAMP ; Army Research Lab
Faculty Advisor: Armando R?a, firstname.lastname@example.org
Role: I determined the resonant frequency of the uncoated silicon microcantilevers. A laser beam targeting the cantilevers is reflected to a photodetector that then converts the light signal to into a voltage signal, which is interpreted by a spectrum analyzer. Using a spectrum analyzer, the resonant frequencies of the cantilevers can then be determined by looking for the maximum voltage peaks for the targeted cantilever beams. After the deposition of the material, I did the same procedure for the coated microcantilevers. Utilizing the dimensions, density and Young?s modulus of the uncoated cantilever, along with the thickness and density of the coating, the modulus of elasticity for the thin film was then determined.